化工原料模板

Surface characterization analysis is to analyze the energy spectrum, spectrum, mass spectrum, spatial distribution or diffraction image of electrons, photons, ions, atoms, strong electric field, heat energy, etc. scattered or emitted from the surface by using the interaction of electrons, photons, ions, atoms, and solid surfaces to obtain information such as surface composition, surface structure, surface electronic states, and surface physical and chemical processes. Advanced material characterization methods include surface element composition, chemical state and its distribution on the surface.

Surface characterization analysis is to analyze the composition, structure and energy state of the thin layer on the solid surface or interface with only a few atomic layers, and reveal the surface morphology, composition, structure or state of materials and products.

CASfire has a team of highly qualified analytical chemistry scientists (Ph.D., and Researchers), providing more accurate, efficient and constructive surface characterization analysis solutions.

(1). Surface chemical composition: composition of surface elements, distribution of surface elements, chemical state of surface elements, surface chemical bond, chemical reaction, etc; Available technologies: XPS (X-ray Photoelectron Spectroscopy), AES (Auger Electron Spectroscopy), SIMS (Secondary Ion Mass Spectroscopy), ISS (Ion Scanning Spectroscopy).

(2). Surface atomic structure: geometric configuration of atoms in the surface layer to determine the precise position between atoms. Surface relaxation, surface reconstruction, surface defects, surface morphology;

(3). Surface atomic state: surface atomic vibration state, surface adsorption, surface diffusion, etc;

(4). Surface electronic state: surface charge density distribution and energy distribution, surface energy level property, surface density of state distribution, valence band structure, work function, surface elementary excitation.