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Instruments Center
Element and Orgnic Analysis Platform

The instruments for element and orgnic analysis:

X-ray photoelectron spectrometer XPS, X-ray diffractometer XRD, inductively coupled plasma mass spectrometer ICP-MS, X-ray fluorescence spectrometer XRF, inductively coupled plasma emission spectrometer ICP-OES, atomic absorption spectrometer AAS, total organic halogen analyzer, total organic carbon analyzer, element analyzer, stable isotope ratio mass spectrometer, high performance liquid chromatography tandem triple quadrupole mass spectrometer, Ultra high performance liquid chromatography tandem quadrupole time-of-flight mass spectrometer, matrix assisted laser desorption/ionization time-of-flight mass spectrometer, gas chromatograph, gas chromatography-mass spectrometer GC/MS, high performance liquid chromatograph HPLC, ion chromatograph IC, confocal micro Raman spectrometer, Fourier transform infrared spectrometer FTIR, fluorescence spectrometer, ultraviolet visible spectrophotometer, thermogravimetric analyzer, etc.

Application field:

- Organic materials such as plastics, rubber, adhesives, fibers, coatings, composites, etc. also include additives used in products, such as plasticizers, vulcanizers, defoamers, softeners, flame retardants, surfactants, etc.

- Glass, ceramics, cement, soil, ore, combustion ash and other inorganic materials, such as calcium carbonate, silicon oxide, sodium chloride, various elements in the periodic table, etc.

- Metal components, such as metal components in plastics, impure alloys, precious metal components, etc.

- Stable isotope analysis

- Composition and element analysis of various new materials

- According to the requirements of customers, we can design the personalized analysis scheme of materials.


Surface Characterization Analysis Platform

The analycial instrument for surface characterization:

Field emission scanning electron microscope, X-ray photoelectron spectrometer XPS, transmission electron microscope TEM, specific surface pore size analyzer, nano particle size potential analyzer, laser particle size analyzer, optical video contact angle meter, X-ray diffractometer XRD, X-ray fluorescence spectrometer XRF, etc.


Application field: It is used for material microscopic analysis to identify the composition of material elements, and give the information of surface, micro area and depth distribution; It can observe the chemical shifts related to the atomic oxidation state, atomic charge and functional group, and can measure the relative concentration of both elements and different oxidation states of the same element; It not only provides information on molecular structure and atomic valence state for chemical research, but also provides information on element composition and content, chemical state, molecular structure, chemical bond, etc. of various compounds for material research.

Why Choose Us?
Decades of experience and achievements, CMA&CNAS accreditation, the scientific research and education platform of the CAS, enable us to provided a comprehensive quality improvement solution, from testing and analysis, research and innovation, education and training to quality assure.